Summary
The patterned substrate with alternating SiO2 and octadecyltrichlorosilane (OTS) self-assembled monolayers (SAM) was used to induce phase separation of PS (polystyrene) and PVP (poly2-vinylpyridine) binary polymer blend films. The PS- and PVP- phase were situated on the OTS and SiO2 domains, respectively. It revealed that even though the characteristic length scales (D) of phase separation were different from the periods of prepatterned substrates (λ), if the surface interaction between each component and substrate is strong enough, the lateral growth of phase separation domains is significantly constrained and the domains replicate the surface patterns.
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The critical volume of phase separation can be calculated by \(\phi_c=\left[\sqrt{\frac{N_A}{N_B}}+1 \right]^{-1}\). N A and N B are the repeat unit number. The repeat unit number of PS (A) (Mn=11.1×104) and PVP (B) (Mn=1.4×104) is about 1000 and 100, respectively. Then the critical volume of PS (φc(A)) is about 24% and the critical volume of PVP (φc(B)) is about 76%. The critical weight ratio of PS and PVP is 1:3.4
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Cui, L., Zhang, Z., Li, X. et al. Surface-induced Phase Separation of Binary Polymer Blends on the Chemically Patterned Substrate. Polym. Bull. 55, 131–140 (2005). https://doi.org/10.1007/s00289-005-0404-3
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DOI: https://doi.org/10.1007/s00289-005-0404-3