Elsevier

Chemical Physics Letters

Volume 223, Issue 4, 24 June 1994, Pages 336-340
Chemical Physics Letters

Atomic force microscopy of local compliance at solid—liquid interfaces

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Abstract

A modified atomic force microscope (AFM) is used to directly measure the local compliance of ordered liquid layers at solid—liquid interfaces. Measurements of the compliance of the solvation structure for octamethylcyclotetrasiloxane and n-dodecanol near graphite and mica surfaces are presented. We show that reasonable correlation decay lengths, molecular sizes, and material rigidities can be determined. The new method is based on a force modulation technique and can be more sensitive to weak longer range interactions compared with the more direct measurement of forces using the static deflection of the AFM cantilever.

References (14)

  • J.C. Henniker

    Rev. Mod. Phys.

    (1949)
  • J.N. Israelachvili

    Surf. Sci. Rept.

    (1991)
  • J.N. Israelachvili
    (1992)
  • R.G. Horn et al.

    J. Chem. Phys.

    (1981)
  • J.N. Israelachvili et al.

    Nature

    (1982)
  • M.L. Gee et al.

    J. Chem. Phys.

    (1990)
  • R. Erlandsson et al.

    J. Vacuum Sci. Technol.

    (1988)
There are more references available in the full text version of this article.
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