Divacancy acceptor levels in ion-irradiated silicon

B. G. Svensson, B. Mohadjeri, A. Hallén, J. H. Svensson, and J. W. Corbett
Phys. Rev. B 43, 2292 – Published 15 January 1991
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Abstract

High-purity n-type silicon samples have been irradiated with mega-electron-volt ions (1H+, He2+4, O4+16, S7+32, Br8+79, and I10+127), and the two divacancy-related acceptor levels ∼0.23 and ∼0.42 eV below the conduction band (Ec), respectively, have been studied in detail using deep-level transient spectroscopy (DLTS). Depth concentration profiles show identical values for the two levels at shallow depths, while in the region close to the damage peak large deviations from a one-to-one proportionality are found. These deviations increase with ion dose and also hinge strongly on the density of energy deposited into elastic collisions per incoming ion. Evidence for a model of the two levels is presented and, in particular, the model invokes excited states caused by motional averaging and lattice strain associated with damaged regions.

The divacancy center is known to exhibit a pronounced Jahn-Teller distortion at low temperatures (≤20 K), and three equivalent electronic distortion directions exist. However, at higher temperatures (≥30 K) reorientation (bond switching) from one distortion direction to another takes place; in a perfect lattice the reorientation rate ultimately becomes so high that the defect does not relax in the distorted configurations, and a motionally averaged state with an effective point-group symmetry of D3d appears. At the temperatures where the DLTS peaks at Ec-0.23 and Ec-0.42 eV are observed, the reorientation time for bond switching is several orders of magnitude smaller than the time for electron emission from the two levels. This implies strongly that the levels originate from the motionally averaged state and not from the distorted state. Consequently, a clear distinction must be made between these DLTS peaks and the charge-state transitions observed in low-temperature studies where the divacancy is frozen in one of the three equivalent distorted configurations. Finally, the association of electronic energy levels with motionally averaged states is expected to apply not only for the divacancy but also for other defects where dynamic effects occur, e.g., the monovacancy and the E center.

  • Received 7 June 1990

DOI:https://doi.org/10.1103/PhysRevB.43.2292

©1991 American Physical Society

Authors & Affiliations

B. G. Svensson and B. Mohadjeri

  • The Royal Institute of Technology, Solid State Electronics, P.O. Box 1298, S-164 28 Kista-Stockholm, Sweden

A. Hallén

  • Department of Radiation Sciences, Uppsala University, P.O. Box 535, S-751 21 Uppsala, Sweden

J. H. Svensson

  • Department of Physics and Measurement Technology, University of Linköping, S-581 83 Linköping, Sweden

J. W. Corbett

  • Department of Physics, The State University of New York at Albany, Albany, New York 12222

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Vol. 43, Iss. 3 — 15 January 1991

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