Mechanisms of visible-light emission from electro-oxidized porous silicon

J. C. Vial, A. Bsiesy, F. Gaspard, R. Hérino, M. Ligeon, F. Muller, R. Romestain, and R. M. Macfarlane
Phys. Rev. B 45, 14171 – Published 15 June 1992
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Abstract

High-porosity porous silicon, after electrochemical oxidation, is a stable and highly reproducible luminescent material with a luminescence quantum efficiency as high as 3% at room temperature. Luminescence decay rates as long as several hundreds of microseconds show that radiative and nonradiative processes both have low efficiencies even at room temperature. This shows that confinement of carriers inside nanometer-sized crystallites does not have a noticeable effect on indirect-band-gap selection rules but restricts strongly the different processes for nonradiative deexcitation. An analysis of the dependence of the nonradiative-decay rates on carrier confinement in terms of the tunneling of carriers through silicon oxide barriers surrounding the confined zone accounts well for our experimental results with an average barrier thickness of 5 nm. This tunneling model is also used to explain successfully the increase in quantum efficiency with the increase of the level of oxidation.

  • Received 31 December 1991

DOI:https://doi.org/10.1103/PhysRevB.45.14171

©1992 American Physical Society

Authors & Affiliations

J. C. Vial, A. Bsiesy, F. Gaspard, R. Hérino, M. Ligeon, F. Muller, and R. Romestain

  • Laboratoire de Spectrométrie Physique, Université Joseph Fourier de Grenoble, Boîte Postale 87, 38402 Saint Martin d’Hères, France

R. M. Macfarlane

  • I. B. M. Almaden Research Center, 650 Harry Road, San Jose, California 95120

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Vol. 45, Iss. 24 — 15 June 1992

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