Effect of tip morphology on image formation in noncontact atomic force microscopy: InP(110)

J. Tóbik, I. Štich, and K. Terakura
Phys. Rev. B 63, 245324 – Published 7 June 2001
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Abstract

We have performed ab initio simulations of atomic force microscopy (AFM) image formation in the non- contact regime for the InP(110)1×1 surface. We use classical perturbation theory to compute the experimentally measured frequency shifts and the density-functional theory to describe the tip-surface interactions. Particular attention is paid to the effect of tip morphology. We consider three different tip apexes: Si, In, and P with the concomitant differences in the dangling-bond states of the tip. We find that the Si and In apexes produce qualitatively similar results, where the anion (P) sublattice shows up as protrusions. Qualitatively different results are obtained with the P apex which produces the largest apparent AFM corrugation and a complete reversal of the surface corrugation with respect to both the Si and In apexes as well as with respect to the real geometric corrugation.

  • Received 17 July 2000

DOI:https://doi.org/10.1103/PhysRevB.63.245324

©2001 American Physical Society

Authors & Affiliations

J. Tóbik and I. Štich

  • Center for Computational Materials Science (CCMS), Department of Physics, Slovak Technical University (FEI STU), Ilkovičova 3, SK-812 19 Bratislava, Slovakia

K. Terakura

  • Joint Research Center for Atom Technology (JRCAT), National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-8562, Japan
  • Tsukuba Advanced Computing Center, 1-1-4 Higashi, Tsukuba, Ibaraki 305-8561, Japan

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Vol. 63, Iss. 24 — 15 June 2001

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