Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface

R. Hoffmann, D. Weiner, A. Schirmeisen, and A. S. Foster
Phys. Rev. B 80, 115426 – Published 21 September 2009

Abstract

We compare the three-dimensional force field obtained from frequency-distance measurements above the NaCl(001) surface to atomistic calculations using various tip models. In the experiments, long-range forces cause a total attractive force even on the similarly charged site. Taking force differences between two sites minimizes the influence of such long-range forces. The magnitude of the measured force differences are by a factor of 6.5–10 smaller than the calculated forces. This is an indication that for the particular tip used in this experiment several atoms of the tip interact with the surface atoms at close tip-sample distances. The interaction of these additional atoms with the surface is small at the imaging distance, because symmetric images are obtained. The force distance characteristics resemble those of a negative tip apex ion which could be explained, e.g., by a neutral Si tip.

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  • Received 12 February 2009

DOI:https://doi.org/10.1103/PhysRevB.80.115426

©2009 American Physical Society

Authors & Affiliations

R. Hoffmann1, D. Weiner2,3,*, A. Schirmeisen2,3, and A. S. Foster4,5

  • 1Physikalisches Institut and DFG Center for Functional Nanostructures (CFN), Universität Karlsruhe, D-76128 Karlsruhe, Germany
  • 2Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany
  • 3Center for Nanotechnology (CeNTech), Heisenbergstraße 11, 48149 Münster, Germany
  • 4Department of Applied Physics, Helsinki University of Technology, P.O. Box 1100, Helsinki 02015, Finland
  • 5Department of Physics, Tampere University of Technology, P.O. Box 692, Tampere 33101, Finland

  • *Present address: SPECS Zürich GmbH, Technoparkstrasse 1, 8005 Zürich, Switzerland.

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Vol. 80, Iss. 11 — 15 September 2009

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