Towards Quantitative Understanding of Formation and Stability of Ge Hut Islands on Si(001)

Guang-Hong Lu and Feng Liu
Phys. Rev. Lett. 94, 176103 – Published 3 May 2005

Abstract

We analyze Ge hut island formation on Si(001), using first-principles calculations of energies, stresses, and their strain dependence of Ge/Si(105) and Ge/Si(001) surfaces combined with continuum modeling. We give a quantitative assessment on strain stabilization of Ge(105) facets, estimate the critical size for hut nucleation or formation, and evaluate the magnitude of surface stress discontinuity at the island’s edge and its effect on island stability.

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  • Received 14 January 2005

DOI:https://doi.org/10.1103/PhysRevLett.94.176103

©2005 American Physical Society

Authors & Affiliations

Guang-Hong Lu1,2 and Feng Liu2,*

  • 1School of Science, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
  • 2Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah 84112, USA

  • *Electronic address: fliu@eng.utah.edu

See Also

Role of Strain-Dependent Surface Energies in Ge/Si(100) Island Formation

O. E. Shklyaev, M. J. Beck, M. Asta, M. J. Miksis, and P. W. Voorhees
Phys. Rev. Lett. 94, 176102 (2005)

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Vol. 94, Iss. 17 — 6 May 2005

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