Paper
19 January 1999 Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating
Rainer Heintzmann, Christoph G. Cremer
Author Affiliations +
Abstract
High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rainer Heintzmann and Christoph G. Cremer "Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating", Proc. SPIE 3568, Optical Biopsies and Microscopic Techniques III, (19 January 1999); https://doi.org/10.1117/12.336833
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Cited by 464 scholarly publications and 1 patent.
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KEYWORDS
Diffraction gratings

Modulation

Objectives

Microscopy

Fourier transforms

Microscopes

Image processing

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