Abstract
A clean Si(001) surface thermally purified in an ultrahigh vacuum molecular-beam epitaxy chamber has been investigated by means of scanning tunneling microscopy. The morphological peculiarities of the Si(001) surface have been explored in detail. The classification of the surface structure elements has been carried out, the dimensions of the elements have been measured, and the relative heights of the surface relief have been determined. A reconstruction of the Si(001) surface prepared in the molecular-beam epitaxy chamber has been found to be (8 × n). A model of the Si(001)-(8 × n) surface structure is proposed.
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Arapkina, L.V., Shevlyuga, V.M. & Yuryev, V.A. Structure and peculiarities of the (8 × n)-type Si(001) surface prepared in a molecular-beam epitaxy chamber: A scanning tunneling microscopy study. Jetp Lett. 87, 215–219 (2008). https://doi.org/10.1134/S0021364008040085
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DOI: https://doi.org/10.1134/S0021364008040085